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Title: 1/f noise in semiconductor and metal nanocrystal solids

Abstract

Electrical 1/f noise is measured in thin films of CdSe, CdSe/CdS, ZnO, HgTe quantum dots and Au nanocrystals. The 1/f noise, normalized per nanoparticle, shows no systematic dependence on the nanoparticle material and the coupling material. However, over 10 orders of magnitude, it correlates well with the nearest neighbor conductance suggesting some universal magnitude of the 1/f noise in these granular conductors. In the hopping regime, the main mechanism of 1/f noise is determined to be mobility fluctuated. In the metallic regime obtained with gold nanoparticle films, the noise drops to a similar level as bulk gold films and with a similar temperature dependence.

Authors:
; ;  [1]
  1. James Franck Institute, The University of Chicago, 929 E 57th Street, Chicago, Illinois 60637 (United States)
Publication Date:
OSTI Identifier:
22273575
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 115; Journal Issue: 15; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 77 NANOSCIENCE AND NANOTECHNOLOGY; CADMIUM SELENIDES; CADMIUM SULFIDES; CARRIER MOBILITY; COUPLING; GOLD; MERCURY TELLURIDES; NOISE; QUANTUM DOTS; SEMICONDUCTOR MATERIALS; SOLIDS; TEMPERATURE DEPENDENCE; THIN FILMS; ZINC OXIDES

Citation Formats

Liu, Heng, Lhuillier, Emmanuel, and Guyot-Sionnest, Philippe. 1/f noise in semiconductor and metal nanocrystal solids. United States: N. p., 2014. Web. doi:10.1063/1.4871682.
Liu, Heng, Lhuillier, Emmanuel, & Guyot-Sionnest, Philippe. 1/f noise in semiconductor and metal nanocrystal solids. United States. https://doi.org/10.1063/1.4871682
Liu, Heng, Lhuillier, Emmanuel, and Guyot-Sionnest, Philippe. 2014. "1/f noise in semiconductor and metal nanocrystal solids". United States. https://doi.org/10.1063/1.4871682.
@article{osti_22273575,
title = {1/f noise in semiconductor and metal nanocrystal solids},
author = {Liu, Heng and Lhuillier, Emmanuel and Guyot-Sionnest, Philippe},
abstractNote = {Electrical 1/f noise is measured in thin films of CdSe, CdSe/CdS, ZnO, HgTe quantum dots and Au nanocrystals. The 1/f noise, normalized per nanoparticle, shows no systematic dependence on the nanoparticle material and the coupling material. However, over 10 orders of magnitude, it correlates well with the nearest neighbor conductance suggesting some universal magnitude of the 1/f noise in these granular conductors. In the hopping regime, the main mechanism of 1/f noise is determined to be mobility fluctuated. In the metallic regime obtained with gold nanoparticle films, the noise drops to a similar level as bulk gold films and with a similar temperature dependence.},
doi = {10.1063/1.4871682},
url = {https://www.osti.gov/biblio/22273575}, journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 15,
volume = 115,
place = {United States},
year = {Mon Apr 21 00:00:00 EDT 2014},
month = {Mon Apr 21 00:00:00 EDT 2014}
}